CURRENT ACTIVITIES
The MTT-S Magazine
Coming
Your Way in May
IEEE Microwave
Magazine is publishing a special IMS bonus issue that will
examine technical sessions, events, and new opportunities
scheduled for the upcoming IMS in Boston this June. The issue
will provide technical background on some of the special sessions
in the form of feature articles by the session organizers.
Be sure to look for the issue in your mailbox, and use it
to help plan your time at IMS2009! >>
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MicroApps
David Menzer, Chair
The Microwave Applications Seminars (MicroApps) serves as a forum for Exhibitors to present the technology behind their commercial products and their special capabilities.
Again, this year, MicroApps is being hosted by Agilent Technologies and will feature a variety of measurement specific presentations by Agilent’s measurement experts as
well as a variety of other presentations from other exhibitors. Attendees will receive a free CD-ROM that includes informative details from every presentation. This year’s
MicroApps will be located in the Exhibition Hall between the main entrance escalators. For more information on the Agilent presentations please visit www.agilent.com/find/
IMS2009 where you can see how Agilent is helping connect expert to expert to solve tough design and measurement challenges.
Tuesday
09:20 - 09:40
Fast Component Characterization
Using Modern Network Analysis
Techniques
Guillaume PAILLONCY, NMDG |
13:20 - 13:40
Low Noise, Low Harmonics and
High Output Power – a Powerful
Signal Generator Combination for
High Performance Receiver Testing
Paul Schmitz, Agilent Technologies, Inc |
16:20 - 16:40
Application of Connectorless
Connections to Microwave Switch
Matrices
Greg Mau, Custom Microwave Components,
Inc. |
12:40 - 13:00
Microstrip Launched Filters
Craig Higginson and Sunita Shah, Q
Microwave Inc. |
10:00 - 10:20
Basic RADAR Measurements Using
Modern Spectrum Analyzers
Richard Overdorf, Agilent Technologies, Inc |
13:40 - 14:00
Connectors – Precision or Not?
Sathya Padmanabhan, Sr. Microwave
Engineer, Maury Microwave Corporation |
16:40 - 17:00
Basics for the Young (or “Less
Experienced”) RF/Microwave
Subsystem
Greg Mau, Custom Microwave Components,
Inc. |
13:00 - 13:20
New Measurement Technique
of Testing Instantaneous Phase
Fluctuation of Signal Sources
Akihiko Oginuma, Agilent Technologies, Inc |
10:20 - 10:40
Intermodulation Distortion
Measurements with Improved
Speed and Accuracy Considerations
Hiroyuki Maehara, Agilent Technologies, Inc |
14:00 - 14:20
High-Speed Testing of Multi-State RF/
Microwave Devices and Sub-Systems
Larry Smith, Director of Custom Test Systems,
Auriga Measurement Systems, LLC; Loren Betts,
Research Scientist, Agilent Technologies, Inc. |
Wednesday
10:20 - 10:40
Test Solutions for LTE/MIMO
Basestation Antennas
Rick Hartman, President; Drew Martin, Sales
Manager; Summitek Instruments |
13:40 - 14:00
Ultra-Fast Noise Parameter
Measurements with Improved
Accuracy
Gary Simpson, Chief Technical Officer, Maury
Microwave Corporation |
11:00 - 11:20
mmWave Power Leveling and True
Mode Stimulus Application
Suren Singh, Agilent Technologies, Inc |
14:20 - 14:40
Fast, Flexible Automated Pulsed
IV/RF Measurements for Accurate
Non-linear Model Development
David Wandrei, Chief Scientist, Auriga
Measurement Systems, LLC; Loren Betts,
Research Scientist, Agilent Technologies, Inc. |
10:40 - 11:00
Multi-Frequency Tuning using
Cascaded Mechanical Tuners
Roman Meierer, Gary Simpson, Maury
Microwave Corporation |
14:00 - 14:40
Nonlinear Vector Network Analysis
and Applications of X-parameters
Loren Betts, Research Scientist, Agilent
Technologies, Inc |
11:40 - 12:00
Coherent Multi-Channel &
Diversity Systems
John Hansen, Agilent Technologies, Inc |
14:40 - 15:00
Agilent Teams-up With T-Tech to
Deliver the Fastest Way to Go
From Idea to Prototype for RF
Board Design
Mounir Adada, Agilent Technologies, Inc |
11:00 - 11:20
OE Microwave Filters and
Oscillators
Danny Fung, OEWaves, Inc. |
14:40 - 5:00
Load Pull with X-Parameters
Produces Instant Large Signal
Model with High Accuracy
Gary Simpson, Chief Technical Officer, Maury
Microwave Corporation |
12:20 - 12:40
Low Cost and High Performance
GaAs MMIC Solutions for
Automotive Radar
Markus Behet, TriQuint Semiconductor,
GmbH |
15:00 - 15:20
Spatially Combined Amplifiers for
Wide Band Power Applications
Scott Behan, Cap Wireless, Inc. |
11:20 - 12:00
Prevention of Multipaction and
PIM Mitigation in High Power,
Space-based Applications
Vahid Badii, PhD., Meggitt Safety Systems,
Inc. |
15:00 - 15:20
New Ultra-High Output Power
Signal Generator Simplifies High
Power Amplifier Testing
Paul Schmitz, Agilent Technologies, Inc |
12:40 - 13:00
Advanced MMIC Chipsets for
3G/4G Digital Microwave Radio
Transceivers
Mark Hebeisen, Endwave Corporation |
15:20 - 15:40
4G System-Level Performance
Simulation Strategy for Highly
Manufacturable RFICs
Paul Colestock, Agilent Technologies, Inc |
12:00 - 12:20
Design Considerations and Methodologies
for Low-loss, Highly Integrated
Broadband Microwave Modules
Kavita Goverdhanam, Oksana Manzhura,
Kenneth Hermanny, Shawn Dow, Nishant Patel,
Anthony Pospishil, Micro-Con/Micronetics |
15:20 - 15:40
Efficient and Causal Modeling of
Multilayer Transmission Lines in
ADS 2009
Radoslaw M. Biernacki and Yunhui Chu,
Agilent Technologies, Inc |
13:00 - 13:20
New Low-Cost GaAs MMIC
Technologies for Millimeter Wave
Applications
Mike Peters, Triquint Semiconductor |
16:00 - 16:20
Enhanced Primary Noise
Calibration Systems (DC-110GHz) –
Accuracy and Advantages
Sathya Padmanabhan, Sr. Microwave
Engineer, Maury Microwave Corporation |
12:20 - 12:40
Testing Methods and
Interoperability Analysis of a
Software Defined Radio
Richard Overdorf, Agilent Technologies, Inc |
16:00 - 16:20
Measuring Amplifier Large Signal
Noise Figure via Phase Noise
Jason Breitbarth, PhD., Holzworth
Instrumentation |
16:20 - 16:40
SiGe Capabilities for High
Frequency Applications
Melinda Jarrell, Jazz Semiconductor |
10:00 - 10:20
EMPIRE XCcel - Fast 64 bit EM
Simulation Exploiting Modern
Multicore CPU Technology
W. Simon, A. Lauer, A. Wien, IMST GmbH |
11:20 - 11:40
SMT Equalizer for Gain
Compensation in X Band Amplifiers
Alen Fejzuli, Shawn Karr, Gabriel Orozco,
EMC/RF Labs |
12:40 - 13:00
GEMS Software and Turnkey
System
Wen Yu, Phd., Computer and
Communication Unlimited |
16:40 - 17:00
IonScan 800 – Ultra-precise
Frequency and Film thickness
Trimming for Semiconductor
Industry
Andrea Kunz, Roth & Rau AG |
10:20 - 10:40
EM.CUBE® Electromagnetic
Modules - A Collaborative
Userware and Benchmarking
Environment
Kazem F. Sabet, PhD., EMAG Technologies Inc. |
11:40 - 12:00
QuickSyn™ — A Compact, Fast-
Switching, Low-Phase-Noise
Frequency Synthesizer
Alexander Chnakin, Phase Matrix, Inc. |
13:00 - 13:20
CAD Software Solutions for
Passive Waveguide Components
and Horn Antennas with Mician’s
μWave Wizard
Dr. Ralf Beyer, Mician GmbH |
Thursday
09:20 - 09:40
Ferrite Components
Dr. Anthony Edridge, Rene Quintanilla, M2 Global
Technology, Ltd. |
10:40 - 11:00
Virtuoso Spectre GXL with “Turbo”
Technology Enables Complete
Verification of Multi-band
Digitally-controlled RFIC
Hany Elhak, Cadence Design Systems |
12:00 - 12:40
High Power Amplifier Design Using
Non-Linear Models in Agilent
Genesys
Marvin Marbell, Chris Reul, Lawrence
Dunleavy, Modelithics, Inc. |
13:20 - 13:40
High Dynamic Range Hybrid
Integrated Fiber Transmitters
John A. MacDonald, Linear Photonics,LLC |
09:40 - 10:00
Next Generation EM Analysis
Software
Scott Langdon, Remcom, Inc. |
11:00 - 11:20
Advances in EM Simulation of
Large Structures
Milos Pavlovic, WIPL-D d.o.o. |
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